Noise measurements on MnSi thin films

EasyChair Preprint 1207

Abstract

Noise measurements are supposed to be a powerful tool to study the dynamical properties of a driven lattice of magnetic skyrmions. In analogy to the properties of driven superconducting vortices, broad-band and narrow band noise is expected to probe the microscopic pinning potential and low-frequency dynamics of the skyrmion lattice. We present first measurements of fluctuation spectroscopy on epitaxial grown MnSi thin film samples. We observe generic 1/f-type noise, however with only a weak temperature dependence and no signatures of a magnetic skyrmion phase, which may be explained by electronic inhomogeneities or the absence of a well-defined skyrmionic phase in these samples subject to subtrate-induced strain. Upon approaching the helical magnetically ordered phase in zero field, we observe an enhancement of the 1/f-type fluctuations and two-level switching of a characteristic energy, possibly related to the switching of magnetic grains/clusters.

Keyphrases: 1/f noise, Fluctuation Spectroscopy, Skyrmions, thin films

@booklet{EasyChair:1207,
  author    = {Merlin Mitschek and David Schroeter and Dirk Menzel and Stefan Süllow and Jens Müller},
  title     = {Noise measurements on MnSi thin films},
  howpublished = {EasyChair Preprint 1207},
  year      = {EasyChair, 2019}}