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Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice

EasyChair Preprint 3572

9 pagesDate: June 7, 2020

Abstract

To test an unknown die at its logic address in lieu of BSDL specified ID code, this advanced iJTAG Technology using switch-mode based interposer to self-test a MCM without Known-Good-Dice (KGD). 

Keyphrases: BEOL, Boundary Scan, DDR, Interposer, Known-Good-Die, MCM, chiplet, self-test, substrate

BibTeX entry
BibTeX does not have the right entry for preprints. This is a hack for producing the correct reference:
@booklet{EasyChair:3572,
  author    = {Peter Wang},
  title     = {Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice},
  howpublished = {EasyChair Preprint 3572},
  year      = {EasyChair, 2020}}
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