Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice

EasyChair Preprint 3572

Abstract

To test an unknown die at its logic address in lieu of BSDL specified ID code, this advanced iJTAG Technology using switch-mode based interposer to self-test a MCM without Known-Good-Dice (KGD). 

Keyphrases: BEOL, Boundary Scan, DDR, Interposer, Known-Good-Die, MCM, chiplet, self-test, substrate

@booklet{EasyChair:3572,
  author    = {Peter Wang},
  title     = {Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice},
  howpublished = {EasyChair Preprint 3572},
  year      = {EasyChair, 2020}}